| Systems, devices, and methods for performing a non-contact electrical … |
2022-5-23 |
2022-11-17 |
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| Systems, devices, and methods for aligning a particle beam and performing a non … |
2022-5-06 |
2022-10-20 |
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| Sequenced approach for determining wafer path quality |
2021-8-27 |
2022-7-01 |
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| Pattern-enhanced spatial correlation of test structures to die level responses |
2021-8-06 |
2022-2-10 |
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| Automatic window generation for process trace |
2021-7-23 |
2022-6-01 |
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| Predicting equipment fail mode from process trace |
2021-7-23 |
2022-3-16 |
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| Rational Decision-Making Tool for Semiconductor Processes |
2021-6-04 |
2022-10-13 |
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| Wafer bin map-based root cause analysis |
2021-4-30 |
2023-1-05 |
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| Abnormal wafer image classification |
2021-4-22 |
2021-10-28 |
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| Fin height determination method, device, system, equipment and medium |
2021-3-09 |
2021-7-02 |
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| Method, device, equipment and medium for determining thickness of titanium … |
2021-3-09 |
2021-6-29 |
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| Method and device for processing bare chip scanning result, electronic … |
2021-3-09 |
2021-6-22 |
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| Gray value validity analysis method and device, electronic equipment and … |
2021-3-09 |
2021-6-22 |
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| Predicting die susceptible to early lifetime failure |
2021-3-03 |
2021-12-16 |
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| Orthogonal grid test structure, test device, method and system |
2020-11-10 |
2021-2-26 |
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| Resistance test structure |
2020-10-21 |
2021-4-20 |
2021-4-20 |
| Resistance testing structure and method |
2020-10-21 |
2021-1-15 |
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| Die level product modeling without die level input data |
2020-10-16 |
2021-8-01 |
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| Machine learning variable selection and root cause discovery by cumulative … |
2020-10-16 |
2021-4-22 |
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| Collaborative Learning Model for Semiconductor Applications |
2020-10-14 |
2021-5-13 |
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| Collaborative Learning Models for Semiconductor Applications |
2020-10-14 |
2022-6-14 |
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| Maintenance scheduling for semiconductor manufacturing equipment |
2020-8-25 |
2020-12-10 |
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| System, method and device for processing semiconductor test data and server |
2020-3-06 |
2020-6-30 |
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| Wafer pattern matching method and device, electronic equipment and storage … |
2020-3-06 |
2020-7-03 |
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| Abnormal value detection method and device for bare chip, electronic equipment … |
2020-3-06 |
2020-6-26 |
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| Abnormal data clustering method and device for wafer test, electronic equipment … |
2020-3-06 |
2020-7-10 |
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| Characterization vehicles for printed circuit board and system design |
2019-12-17 |
2020-4-16 |
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| IC with test structures and e-beam pads embedded within a contiguous standard … |
2019-6-30 |
2021-8-03 |
2021-8-03 |
| Failure detection and classsification using sensor data and/or measurement data |
2019-3-08 |
2021-6-08 |
2021-6-08 |
| Direct memory characterization using periphery transistors |
2018-12-06 |
2020-6-09 |
2020-6-09 |
| Standard cell design conformance using boolean assertions |
2018-11-30 |
2020-2-18 |
2020-2-18 |
| IC with test structures embedded within a contiguous standard cell area |
2018-9-29 |
2020-9-15 |
2020-9-15 |
| Failure detection for wire bonding in semiconductors |
2018-9-21 |
2020-5-19 |
2020-5-19 |
| Semiconductor yield prediction |
2018-8-24 |
2019-2-28 |
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| Passive array test structure for cross-point memory characterization |
2018-7-11 |
2020-5-05 |
2020-5-05 |
| Generating robust machine learning predictions for semiconductor manufacturing … |
2018-6-12 |
2021-6-08 |
2021-6-08 |
| Method and apparatus for direct testing and characterization of a three … |
2018-6-04 |
2020-9-08 |
2020-9-08 |
| Method for processing a semiconductor wafer using non-contact electrical … |
2018-3-31 |
2019-2-05 |
2019-2-05 |
| Method for manufacturing a semiconductor product wafer |
2017-12-18 |
2018-4-19 |
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| Process for making an integrated circuit that includes NCEM-Enabled, tip-to- … |
2017-9-30 |
2018-3-27 |
2018-3-27 |
| Process for making ICs from standard logic cells that utilize TS cut mask(s) … |
2017-9-22 |
2019-4-16 |
2019-4-16 |
| Snap-to valid pattern system and method |
2017-9-05 |
2020-10-13 |
2020-10-13 |
| IC chips containing a mixture of standard cells obtained from an original set … |
2017-7-07 |
2020-4-14 |
2020-4-14 |
| Process for making and using a semiconductor wafer containing first and second … |
2017-6-28 |
2018-1-09 |
2018-1-09 |
| Process for making and using a semiconductor wafer containing first and second … |
2017-6-28 |
2018-10-09 |
2018-10-09 |
| Process for making and using a semiconductor wafer containing first and second … |
2017-6-27 |
2017-9-19 |
2017-9-19 |
| Process for making and using a semiconductor wafer containing first and second … |
2017-6-27 |
2017-10-10 |
2017-10-10 |
| Test structures for measuring silicon thickness in fully depleted silicon-on- … |
2017-6-01 |
2020-12-01 |
2020-12-01 |
| Process for making and using a semiconductor wafer containing first and second … |
2017-3-31 |
2017-8-29 |
2017-8-29 |
| Process for making and using a semiconductor wafer containing first and second … |
2017-3-31 |
2017-9-26 |
2017-9-26 |
| Integrated circuit containing first and second DOEs of standard cell compatible … |
2017-3-29 |
2017-7-18 |
2017-7-18 |
| Advanced manufacturing insight system for semiconductor application |
2017-3-24 |
2019-4-23 |
2019-4-23 |
| On-chip capacitance measurement for memory characterization vehicle |
2017-2-23 |
2018-10-09 |
2018-10-09 |
| Direct access memory characterization vehicle |
2017-2-23 |
2019-9-10 |
2019-9-10 |
| Integrated circuit containing standard logic cells and library-compatible, NCEM … |
2017-2-15 |
2017-6-27 |
2017-6-27 |
| Process control techniques for semiconductor manufacturing processes |
2016-12-29 |
2019-10-01 |
2019-10-01 |
| Direct probing characterization vehicle for transistor, capacitor and resistor … |
2016-9-22 |
2019-8-13 |
2019-8-13 |
| Test structures and method for electrical measurement of FinFET fin height |
2016-9-19 |
2020-1-07 |
2020-1-07 |
| Method for applying charge-based-capacitance-measurement with switches using … |
2016-9-19 |
2020-5-05 |
2020-5-05 |
| Method for accurate measurement of leaky capacitors using charge based … |
2016-9-19 |
2018-4-24 |
2018-4-24 |
| Process for making and using mesh-style NCEM pads |
2016-9-08 |
2018-3-06 |
2018-3-06 |
| D flip-flop cells, with DFM-optimized M0 cuts and V0 adjacencies |
2016-9-08 |
2017-4-18 |
2017-4-18 |
| Process for making semiconductor dies, chips, and wafers using in-line … |
2016-4-04 |
2020-3-17 |
2020-3-17 |
| Standard cell library with DFM-optimized M0 cuts |
2016-3-11 |
2016-12-27 |
2016-12-27 |
| E-beam inspection apparatus and method of using the same on various integrated … |
2016-1-06 |
2016-4-28 |
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| E-beam inspection apparatus and method of using the same on various integrated … |
2016-1-06 |
2016-11-15 |
2016-11-15 |
| Process control techniques for semiconductor manufacturing processes |
2015-11-25 |
2020-8-04 |
2020-8-04 |
| Opportunistic placement of ic test structures and/or e-beam target pads in … |
2015-6-12 |
2015-12-17 |
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| Flip-flop, latch, and mux cells for use in a standard cell library and … |
2014-10-24 |
2015-12-01 |
2015-12-01 |
| High-yielding standard cell library and circuits made therefrom |
2013-4-19 |
2016-9-06 |
2016-9-06 |
| Integrated circuit having high pattern regularity |
2011-8-23 |
2013-11-19 |
2013-11-19 |
| Manufacturing of integrated circuit devices using a global predictive … |
2011-2-22 |
2011-9-01 |
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| Apparatus and method for electrical detection and localization of shorts in … |
2011-2-15 |
2013-11-05 |
2013-11-05 |
| High density test structure array to support addressable high accuracy 4- … |
2011-2-07 |
2014-12-02 |
2014-12-02 |
| Method and system for mapping a boolean logic network to a limited set of … |
2010-7-13 |
2011-12-20 |
2011-12-20 |
| Layout for dut arrays used in semiconductor wafer testing |
2009-2-10 |
2009-6-04 |
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| Systems and methods for detecting and monitoring nickel-silicide process and … |
2008-10-14 |
2011-4-26 |
2011-4-26 |
| Systems and methods for electrical characterization of inter-layer alignment |
2008-7-31 |
2009-2-05 |
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| Test structures and methods for electrical characterization of alignment of … |
2008-5-16 |
2011-5-03 |
2011-5-03 |
| Measurement structure in a standard cell for controlling process parameters … |
2008-1-30 |
2011-4-19 |
2011-4-19 |
| Normalization of process variables in a manufacturing process |
2008-1-07 |
2009-1-15 |
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| Method and system for grouping logic in an integrated circuit design to … |
2008-1-03 |
2010-11-02 |
2010-11-02 |
| Total predictive monitoring system for semiconductor wafer in integrated … |
2007-12-17 |
2009-6-19 |
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| Test cells for semiconductor yield improvement |
2007-12-14 |
2010-10-05 |
2010-10-05 |
| Method and process for design of integrated circuits using regular geometry … |
2007-10-02 |
2011-3-15 |
2011-3-15 |
| Reusable test chip for inline probing of three dimensionally arranged … |
2007-9-25 |
2013-1-29 |
2013-1-29 |
| Monitoring and control of integrated circuit device fabrication processes |
2007-8-20 |
2008-12-16 |
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| Inspection plan optimization based on layout attributes and process variance |
2007-6-12 |
2010-6-15 |
2010-6-15 |
| Identifying yield-relevant process parameters in integrated circuit device … |
2007-1-17 |
2009-2-24 |
2009-2-24 |
| Method For The Definition Of A Library Of Application-Domain-Specific Logic … |
2007-1-03 |
2008-7-03 |
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| Adjusting die placement on a semiconductor wafer to increase yield |
2006-12-22 |
2007-5-10 |
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| Methods for yield variability benchmarking, assessment, quantification, and … |
2006-11-30 |
2013-7-23 |
2013-7-23 |
| Method for reducing layout printability effects on semiconductor device … |
2006-9-29 |
2010-1-05 |
2010-1-05 |
| Prediction of impact on post-repair yield resulting from manufacturing process … |
2006-8-31 |
2011-10-11 |
2011-10-11 |
| Method for electron beam proximity effect correction |
2006-6-22 |
2009-12-29 |
2009-12-29 |
| Layout compiler |
2006-5-22 |
2007-11-22 |
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| Method for improving mask layout and fabrication |
2005-10-28 |
2008-10-07 |
2008-10-07 |
| Method for evaluating the quality of data collection in a manufacturing … |
2005-8-22 |
2009-5-05 |
2009-5-05 |
| A method for improving efficiency of a manufacturing process such as a … |
2005-8-22 |
2006-2-23 |
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| Method and system for ROM coding to improve yield |
2005-5-13 |
2007-12-04 |
2007-12-04 |